DDCOM XRD Benchtop System

For ultra-fast crystal orientation measurement using the Omega-scan method

The Desktop X-ray Diffractometer for Crystal Orientation Measurement (DDCOM) is an automated tool to determine the orientation of various crystals using the Omega-scan method.

Ultra-fast Omega-scan approach

200 times faster than Theta-scan method
Automatic evaluation of the complete lattice orientation in 3D
Determination of entire crystal orientation within 5 seconds

Compact, user friendly and cost effective

Easily movable and lightweight desktop design
Convenient sample handling and easy to operate
Low energy consumption and operating costs due to air cooled X-ray tube (no water cooling required)

Efficient workflows for quality control

For standard research and industrial workflows
Azimuthal setting and marking of crystal orientation
Preprogrammed cubic crystal parameters
State-of-the-art and convenient software
High precision, i.e up to (1/100°)

Control of cutting, grinding and lapping

Complete lattice orientation of single crystals
Suitable for a unique variety of materials in a large range of size and weight, such as: Wafers from 2-12 in. and Ingots up to 20 kg

Highlights

Determination of the complete lattice orientation of single crystals
Ultra-fast crystal orientation measurement using the Omega-scan method
Determination of the arbitrary unknown orientation of cubic crystals
Designed especially for azimuthal setting and marking of lattice directions
Air cooled X-ray tube, no water cooling required
Appropriate for research and production quality control

Technical specifications

X-ray source	30 W air-cooled X-ray tube, Cu anode
Detectors	Two scintillation counters
Sample holder	Precise turntable, setting accuracy 0.01°, tools for defined sample positioning and marking
Dimensions	23.62 × 23.62 × 33.46
Weight	80 kg
Power supply	100-230 V, 100 W, single phase
Room temperature	≤ 30° C

Examples of measurable materials

Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP
Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC₃C, PbS, PbTe, SnTe, MgO, LiF, MgAl₂O₄, SrTiO₃, LaTiO₃
Tetragonal: MgF₂, TiO₂, SrLaAlO₄
Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO₃, SiO₂ (quartz), Al₂O₃ (sapphire), GaPO₄, La₃Ga₅SiO₁₄
Orthorhombic: Mg₂SiO₄, NdGaO₃
Further materials (possibly) according to the customers' demands

Options

Device for mapping of wafers (maximum diameter 225 mm)
Device for automatic loading from cassettes

Applications for DDCOM

Marking and measuring of in-plane directions

In orientation measurements on large samples, the alingnment of the specimen within the instrument preselects a certain orientation. With respect to the sample main axis, the system can define in-plane and out-of-plane components of the crystal orientation. The Omega Scan is capable of determining all...