SDCOM XRD Benchtop System

• Ability to measure very small crystals down to 1 mm or larger samples

• Variety of sample holders and transfer fixtures towards wire saw, grinding, etc.

• Marking option of lateral crystal direction

• No water cooling

• Highest precision: 0.01° (depending on crystal quality)

• Determination of the complete lattice orientation of single crystals

• Ultra-fast crystal orientation measurement using the Omega-scan method

• Air cooled X-ray tube, no water cooling required

• Appropriate for research and production quality control

• Manual handling (no automation option)

Examples of measurable materials

• Cubic / arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP

• Cubic / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC₃C, PbS, PbTe, SnTe, MgO, LiF, MgAl₂O₄, SrTiO₃, LaTiO₃

• Tetragonal: MgF₂, TiO₂, SrLaAlO₄

• Hexagonal / Trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO₃, SiO₂ (quartz), Al₂O₃ (sapphire), GaPO₄, La₃Ga₅SiO₁₄

• Orthorhombic: Mg₂SiO₄, NdGaO₃

• Further materials according to the customers' demands

Applications for SDCOM