Understanding the MDPpro 850+: Mapping Lifetime and Resistivity in Silicon Materials The MDPpro 850+ is one of several measurement systems developed to characterize silicon materials for photovoltaic and semiconductor applications. This article summarizes publicly available specifications, context, and comparisons for users working with minority-carrier lifetime and resistivity mapping. Core Function The MDPpro 850+ uses μ-PCD/MDP(QSS) methods to measure minority-carrier lifetime and resistivity. These non-contact techniques assess crystal quality, contamination, and defect distribution. The system produces spatial maps of carrier lifetime, resistivity, and photoconductivity—commonly used to identify slip lines, oxygen striations, and contamination that influence processing yield. Measurement Ranges and Formats Lifetime range: 20 ns – 100 ms for samples with resistivity above 0.3 Ω·cm Resistivity range: 0.5–5 Ω·cm, with optional extensions Compatible sample formats: Bricks up to 850 mm length and 210×210 mm² cross-section Wafers up to 300 mm diameter Throughput Characteristics Line scan: < 30 seconds Full wafer/brick map: < 5 minutes These cycle times support inline or near-line deployment where rapid material qualification is needed. Standards and Method Alignment The system aligns with SEMI PV9-1110, the standard test method for measuring excess carrier decay in silicon via μ-PCD. Alignment with SEMI methods supports reproducibility across labs and production facilities. Infrastructure and System Requirements Approx. footprint: 2560 × 1910 × 1440 mm; weight ~200 kg Power: 100–250 VAC, 50–60 Hz Control: Windows 11 PC with .NET support; dual Ethernet ports for instrument + network Functional Extensions Optional modules include: LBIC (Laser Beam Induced Current) for efficiency mapping Iron mapping (Fe-B pairs) for contamination analysis in p-type silicon p/n determination for polarity checks Barcode reader for sample tracking Multi-laser configurations for injection-dependent measurements Placement Within the MDP Family MDPspot – compact, single-spot lifetime measurement for R&D MDPlinescan – conveyor/robot-integrated head for inline testing at <1 s per wafer MDPmap / MDpicts – research tools for injection- or temperature-dependent measurements The MDPpro 850+ balances mapping capability with production-appropriate throughput. Application Context Ingot and wafer qualification before downstream processing Monitoring of crystal growth conditions Process development in PV and semiconductor production Contamination analysis in industrial R&D References Freiberg Instruments. (n.d.-a). MDPpro 850+. Freiberg Instruments. Retrieved August 19, 2025, from https://www.freiberginstruments.com/mdp/mdppro850plusFreiberg Instruments. (n.d.-b). MDP Ingot 850+ product sheet [PDF]. Retrieved August 19, 2025, from https://www.freiberginstruments.com/fileadmin/Product-Sheets/Freiberg_Instruments_MPDingot_850__web.pdfFreiberg Instruments. (n.d.-c). MDPspot product sheet [PDF]. Retrieved August 19, 2025, from https://www.freiberginstruments.com/fileadmin/Product-Sheets/2022-03-22_Product_Sheet_MDPspot.pdfFreiberg Instruments. (n.d.-d). MDPmap product card [PDF]. Retrieved August 19, 2025, from https://www.freiberginstruments.com/fileadmin/Product-Sheets/2024-07-23_Product_Card_MDPmap.pdfPV Education. (n.d.). Minority-carrier lifetime. Retrieved August 19, 2025, from https://www.pveducation.org/pvcdrom/pn-junctions/minority-carrier-lifetimeRotunda Scientific Technologies. (n.d.-a). MDPpro 850+. Retrieved August 19, 2025, from https://www.rotundascitech.com/products/mdppro-850Rotunda Scientific Technologies. (n.d.-b). MDPspot. Retrieved August 19, 2025, from https://www.rotundascitech.com/products/mdpspotRotunda Scientific Technologies. (n.d.-c). MDPlinescan. Retrieved August 19, 2025, from https://www.rotundascitech.com/products/mdplinescanSEMI. (2015). SEMI PV9-0611 (Reapproved 1215): Test method for excess charge carrier decay in PV silicon materials by non-contact measurements of microwave reflectance after illumination. Retrieved August 19, 2025, from https://store-us.semi.org/products/pv00900-semi-pv9Semilab. (n.d.). Carrier lifetime (μ-PCD, QSS-μPCD). Retrieved August 19, 2025, from https://semilab.com/category/products/carrier-lifetime-u-pcd-qss-upcd-0 This article was written in part with the assistance of AI to help organize, summarize, and reference publicly available information.
